Showing results: 136 - 150 of 347 items found.
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AutoShock-II Test System -
L. A. B. Equipment, Inc.
The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.
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Circuit Wizard - CW409 -
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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Leeno Industrial Inc.
Mobile Phone, Tablet, TV Board, Set-top box etc.LEENO can provide a System Level Test solution on various types of packages.
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Integrated Test + Measurement
The Test Cell Vibration Monitoring System is a complete package for monitoring dyno vibration levels generated during engine testing. This system was design to prevent catastrophic dyno failures.
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Teledyne Defense Electronics
Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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TS-201B -
Marvin Test Solutions, Inc.
The TS-201 is a state-of-the-art I-Level and Depot level test set for MIL-STD-1760 and legacy armament systems including launchers and bomb racks.
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NH Research, Inc.
NH Research (NHR) is a leading manufacturer of battery test equipment and system solutions for all battery chemistries, fuel-cells, super capacitors, and energy storage systems. NHR’s battery test equipment includes the 9300 High Voltage Battery Test System and 9200 Battery Test System which provides the flexibility to address today’s higher voltage levels, and modularity to expand for future requirements.
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MS 1111 -
Meltronics Systemtech
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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RT-Tester -
Verified Systems International GMBH
Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
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BOARDWALKER 9627 -
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Electromechanica, Inc.
This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Becker Nachrichtentechnik GmbH
Fully Automatic Test Systems for Lifetime Simulations of Electronic Components. Each output offers a separate, analogue level control. This ensures highest precision in level during a long term usage. A graphical user interface enables an intuitive and easy control.
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NEOSEM TECHNOLOGY INC
We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market. The integrated system with CMB (custom designed Motherboard), Thermal subsystem and Automation technologies provides a Turn-key Automated Test System which reduces Integration risks and time to Volume Production. Our Automated DIMM SLT (System Level Test) System is highly configurable to address our customers needs and environments constraints for Best Cost of Ownership, Best Performance and shortest Time to Yield.
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N2002A -
Keysight Technologies
The N2002A noise source test set is a low cost, stand-alone instrument that, as part of a calibration system, enables fast, repeatable calibrations with minimal levels of uncertainty.
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RMMA -
RightMark Gathering
Before this test packet was created there was no proper software for measuring vital system parameters such as CPU/Chipset/RAM providing steady and reliable (reproducible) test results and allowing for changing test parameters in a wide range. Vital low-level system characteristics include latency and real RAM bandwidth, average/minimal latency of different cache levels and its associativity, real L1-L2 cache bandwidth and TLB levels specs. Besides, these aspects are usually not paid sufficient attention in product technical documentation (CPU or chipset). Such test suite, which combines a good deal of subsets aimed at measuring objective system characteristics, is a must have for estimating crucial objective platform parameters.